A Self-Test Approach Using Accumulators as Test Pattern Generators
نویسنده
چکیده
Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. This paper unalyzes tlie patiern sequences produced by different types of accuriiulators and shows that they can achieve similar ,fault coverage as pseudo-random patterns. Corizpared to file well-known selftest tnethods that insert test registers, the approach using accumulators saves the additional gates that are needed to iniplenient test registers, and it avoids pecfortnunce degracilition diw to atitiitionnl d e l q x
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